Zero-bias conductance and energy gap measurements in LaNiO3-YBa2Cu3O7-x junctions

D. Kumar, K. M. Satyalakshmi, M. S. Hegde, Rajiv K. Singh, P. R. Apte, R. Pinto, Clinton B. Lee

Research output: Contribution to journalArticlepeer-review

Abstract

Conductance measurements of junctions between a high-Tc (YBa2Cu3O7-x) superconductor and a metallic oxide (LaNiO3) have been carried out along the a-b plane to examine the tunnel-junction spectra. For these measurements, in situ LaNiO3 films have been grown on c-axis oriented YBa2Cu3O7-x thin films using the pulsed laser deposition technique. Two distinctive energy gaps have been observed along with conductance peaks around zero bias. The analysis of zero-bias conductance and energy gap data suggests the presence of midgap states located at the centre of a finite energy gap. The results obtained are also in accordance with the d-wave nature of high-Tc YBa2Cu3O7-x superconductors.

Original languageEnglish
Pages (from-to)766-769
Number of pages4
JournalSuperconductor Science and Technology
Volume11
Issue number8
DOIs
StatePublished - Aug 1998
Externally publishedYes

Fingerprint

Dive into the research topics of 'Zero-bias conductance and energy gap measurements in LaNiO3-YBa2Cu3O7-x junctions'. Together they form a unique fingerprint.

Cite this