ZEAL in the Cloud: IoT Labeling System

  • Bar Meyuhas
  • , Anat Bremler-Barr
  • , Tal Shapira

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

ZEAL (Zero-shot Engine for IoT Asset Labeling) is an open-source system that labels never-seen IoT devices by finding their vendor (e.g., Xiaomi, TP-Link) and function (e.g., Light, Plug) based on textual features extracted from the device network traffic, such as domains and hostnames. The system gets as an input features and enriches them using online searches. Then, it applies a string-matching algorithm to label its vendor and large language model (LLM) to label its function. The system is implemented as a serverless architecture on AWS, ZEAL utilizes services such as Lambda, Elastic File System (EFS), and S3, ensuring scalability but economic implementation. This demonstration showcases ZEAL's ability to enhance network visibility and asset management by accurately labeling devices with minimal prior knowledge. The system is open-source publicly accessible via API and GUI for research and business applications (https://labelmydevice.com), licensed under the Apache License 2.0.

Original languageEnglish
Title of host publicationProceedings of IEEE/IFIP Network Operations and Management Symposium 2025, NOMS 2025
EditorsDoug Zuckerman, Mehmet Ulema, Noura Limam, Young-Tak Kim, Lisandro Zambenedetti Granville, Vinicius Fulber-Garcia
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331531638
DOIs
StatePublished - 2025
Externally publishedYes
Event38th IEEE/IFIP Network Operations and Management Symposium, NOMS 2025 - Honolulu, United States
Duration: 12 May 202516 May 2025

Publication series

NameProceedings of IEEE/IFIP Network Operations and Management Symposium 2025, NOMS 2025

Conference

Conference38th IEEE/IFIP Network Operations and Management Symposium, NOMS 2025
Country/TerritoryUnited States
CityHonolulu
Period12/05/2516/05/25

Bibliographical note

Publisher Copyright:
© 2025 IEEE.

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