Y1-xCaxBa2Cu3O7-δ thin films: From phase fluctuations to a complex order parameter

E. Farber, M. Lewkowicz, H. Castro, B. Gorshunov, A. Abramovich, J. P. Contour

Research output: Contribution to journalArticlepeer-review


This report presents a study of the temperature dependence of the penetration depth in Y1-xCaxBa2Cu3O7-δ thin films, which shows that a contribution to the order parameter from phase fluctuations in optimally doped samples cannot be excluded, and demonstrates the appearance of an imaginary component in the order parameter in overdoped samples. Measurements were performed using two complementary techniques: the parallel plate resonator (PPR), operated at 10 GHz, and far infrared (FIR) transmission, where the absolute value of the penetration depth can be obtained.

Original languageEnglish
Pages (from-to)3082-3084
Number of pages3
JournalJournal of Physics and Chemistry of Solids
Issue number12
StatePublished - Dec 2008
Externally publishedYes

Bibliographical note

Funding Information:
This work was supported in part by the Ministry of Science and Technology (MOST), State of Israel, and by the Russian Foundation for Basic Research (RFBR), Russian Federation, reference number 06-02-72023-MHTИ_a.


  • A. Superconductors
  • B. Epitaxial growth
  • C. Infrared spectroscopy
  • D. Optical properties


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