Y1-xCaxBa2Cu3O7-δ thin films: From phase fluctuations to a complex order parameter

E. Farber; M. Lewkowicz; H. Castro; B. Gorshunov; A. Abramovich; J. P. Contour

doi:10.1016/j.jpcs.2008.06.024

Y_1-xCa_xBa₂Cu₃O_7-δ thin films: From phase fluctuations to a complex order parameter

E. Farber, M. Lewkowicz, H. Castro, B. Gorshunov, A. Abramovich, J. P. Contour

Research output: Contribution to journal › Article › peer-review

Abstract

This report presents a study of the temperature dependence of the penetration depth in Y_1-xCa_xBa₂Cu₃O_7-δ thin films, which shows that a contribution to the order parameter from phase fluctuations in optimally doped samples cannot be excluded, and demonstrates the appearance of an imaginary component in the order parameter in overdoped samples. Measurements were performed using two complementary techniques: the parallel plate resonator (PPR), operated at 10 GHz, and far infrared (FIR) transmission, where the absolute value of the penetration depth can be obtained.

Original language	English
Pages (from-to)	3082-3084
Number of pages	3
Journal	Journal of Physics and Chemistry of Solids
Volume	69
Issue number	12
DOIs	https://doi.org/10.1016/j.jpcs.2008.06.024
State	Published - Dec 2008
Externally published	Yes

Bibliographical note

Funding Information:
This work was supported in part by the Ministry of Science and Technology (MOST), State of Israel, and by the Russian Foundation for Basic Research (RFBR), Russian Federation, reference number 06-02-72023-MHTИ_a.

Funding

This work was supported in part by the Ministry of Science and Technology (MOST), State of Israel, and by the Russian Foundation for Basic Research (RFBR), Russian Federation, reference number 06-02-72023-MHTИ_a.

Funders	Funder number
State of Israel
Russian Foundation for Basic Research
Ministerio de Ciencia y Tecnología
Ministry of Health of the Russian Federation	06-02-72023-MHTИ_a

Keywords

A. Superconductors
B. Epitaxial growth
C. Infrared spectroscopy
D. Optical properties

Access to Document

10.1016/j.jpcs.2008.06.024

Cite this

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title = "Y1-xCaxBa2Cu3O7-δ thin films: From phase fluctuations to a complex order parameter",

abstract = "This report presents a study of the temperature dependence of the penetration depth in Y1-xCaxBa2Cu3O7-δ thin films, which shows that a contribution to the order parameter from phase fluctuations in optimally doped samples cannot be excluded, and demonstrates the appearance of an imaginary component in the order parameter in overdoped samples. Measurements were performed using two complementary techniques: the parallel plate resonator (PPR), operated at 10 GHz, and far infrared (FIR) transmission, where the absolute value of the penetration depth can be obtained.",

keywords = "A. Superconductors, B. Epitaxial growth, C. Infrared spectroscopy, D. Optical properties",

author = "E. Farber and M. Lewkowicz and H. Castro and B. Gorshunov and A. Abramovich and Contour, {J. P.}",

note = "Funding Information: This work was supported in part by the Ministry of Science and Technology (MOST), State of Israel, and by the Russian Foundation for Basic Research (RFBR), Russian Federation, reference number 06-02-72023-MHTИ_a.",

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AU - Abramovich, A.

AU - Contour, J. P.

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