XPS analysis of Gd5Ge2Si2and its Co-subsituted alloy

Sanjay Sharma, Pramod Kumar

Research output: Contribution to journalConference articlepeer-review


The investigation reported is the study of electronic structure of the intermetallic compound Gd5Ge2Si2and its Co-substitution i.e. Gd5Ge1.9Si2Co0.1with the help of X-ray photoelectron spectroscopy (XPS). The investigations reveal the crystallization of the compounds to be in a single phase with Orthorhombic structure. The XPS spectra disclose the signature peaks of the various orbitals of the constituent elements of the compounds. Though a subtle shift in the binding energy values is observed. The deconvoluted XPS spectra provides the interaction of the core of the compounds with different neighbours. Deconvolution shows that for Gd(3d) spectra the strongest bonding is for Gd-Ge bond with a binding energy value of ∼ 1190 eV for both the compounds. Also, for Si(2p) spectra this value is close to 102 eV for Si-Ge bond.

Original languageEnglish
Pages (from-to)10597-10599
Number of pages3
JournalMaterials Today: Proceedings
StatePublished - 2021
Externally publishedYes
Event2021 International Conference on Technological Advancements in Materials Science and Manufacturing, ICTAMSM 2021 - Uttarakhand, India
Duration: 20 Feb 202121 Feb 2021

Bibliographical note

Publisher Copyright:
© 2021 Elsevier Ltd. All rights reserved.


  • Electronic structure
  • Intermetallic compounds
  • Magnetic materials
  • Rare-earth based magnetism
  • X-ray photoelectron spectroscopy


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