X-ray reflectivity study of the surface of liquid gallium

E. H. Kawamoto, S. Lee, P. S. Pershan, M. Deutsch, N. Maskil, B. M. Ocko

Research output: Contribution to journalArticlepeer-review

22 Scopus citations


X-ray reflectivity from the surface of liquid gallium was measured under ultrahigh vacuum conditions using a novel technique for curved surfaces. The small deviations between the measured and theoretical Fresnel reflectivity for an ideally sharp flat interface for wave-vector transfer 0.5 A-1 imply an interfacial width for the electron density profile of 1.3±0.2 A. This is consistent with a model of atomic close packing which lacks structure along the surface normal at length scales >10 A.

Original languageEnglish
Pages (from-to)6847-6850
Number of pages4
JournalPhysical Review B
Issue number11
StatePublished - 1993


Dive into the research topics of 'X-ray reflectivity study of the surface of liquid gallium'. Together they form a unique fingerprint.

Cite this