Abstract
X-ray reflectivity from the surface of liquid gallium was measured under ultrahigh vacuum conditions using a novel technique for curved surfaces. The small deviations between the measured and theoretical Fresnel reflectivity for an ideally sharp flat interface for wave-vector transfer 0.5 A-1 imply an interfacial width for the electron density profile of 1.3±0.2 A. This is consistent with a model of atomic close packing which lacks structure along the surface normal at length scales >10 A.
| Original language | English |
|---|---|
| Pages (from-to) | 6847-6850 |
| Number of pages | 4 |
| Journal | Physical Review B |
| Volume | 47 |
| Issue number | 11 |
| DOIs | |
| State | Published - 1993 |