Abstract
We describe a method for measuring the field profile of x-ray ultrashort pulses including phase information. The scheme is based on spectrally interfering two replicas of the same pulse, which are spectrally shifted via three-wave mixing with IR or visible beams. Using a single-shot spectrometer the scheme can be used for the inspection of individual ultrashort x-ray pulses with random amplitudes and phases. Examples for characterization of stochastic pulses with a bandwidth of 1 eV are given, including criteria for a successful measurement.
| Original language | English |
|---|---|
| Article number | 033805 |
| Journal | Physical Review A - Atomic, Molecular, and Optical Physics |
| Volume | 90 |
| Issue number | 3 |
| DOIs | |
| State | Published - 3 Sep 2014 |
Bibliographical note
Publisher Copyright:© 2014 American Physical Society.
Funding
| Funders | Funder number |
|---|---|
| Israel Science Foundation | 1038/13 |