X-ray parametric down-conversion in the Langevin regime

S. Shwartz, R. N. Coffee, J. M. Feldkamp, Y. Feng, J. B. Hastings, G. Y. Yin, S. E. Harris

Research output: Contribution to journalArticlepeer-review

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We experimentally and theoretically study the coincidence count rate for down-converted x-ray photons. Because of photoionization, parametric down-conversion at x-ray wavelengths generally involves loss and the theoretical description requires a Langevin approach. By working in a transmission geometry (Laue) rather than in the Bragg geometry of previous experiments, we obtain an improvement in the signal-to-noise ratio of 12.5, and find agreement between experiment and theory.

Original languageEnglish
Article number013602
JournalPhysical Review Letters
Issue number1
StatePublished - 6 Jul 2012
Externally publishedYes


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