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X-ray multielectronic photoexcitations near the K edge of xenon

  • Moshe Deutsch
  • , Peter Kizler
  • Harvard University
  • German Electron Synchrotron

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

The near-K-edge x-ray photoabsorption spectrum of xenon was measured using synchrotron radiation. Several simultaneous two-electron excitation features were detected. Their identification is supported by nonrelativistic and relativistic energy-level calculations. The relative cross sections extracted from the data are consistent with previous measurements on Kr. Relativistic sudden-approximation-shake-theory cross sections are found to overestimate the measured ones by factors of 23, but closely follow level-dependent trends in the measured data.

Original languageEnglish
Pages (from-to)2112-2115
Number of pages4
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume45
Issue number3
DOIs
StatePublished - 1992

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