Abstract
The development of the Material Science EXAFS line which covers the energy range of 4 keV to > 25 keV is described. The general design parameters of the line have been developed specifically for the application of X-ray absorption spectroscopy to problems in material science. The optics systems consisting of a vertically collimating SiC mirror and a unique four crystal monochromator are described along with the results of extensive ray tracing studies. The two backend configurations to be used on this line will also be discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 631-635 |
| Number of pages | 5 |
| Journal | Nuclear Instruments and Methods In Physics Research |
| Volume | 208 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - 15 Apr 1983 |
| Externally published | Yes |
Bibliographical note
Funding Information:This work was supported in part by the Material Sciences Division of the Deparment of Energy under contract DE-AS05-80-ERI0742.
Funding
This work was supported in part by the Material Sciences Division of the Deparment of Energy under contract DE-AS05-80-ERI0742.
| Funders | Funder number |
|---|---|
| Deparment of Energy | DE-AS05-80-ERI0742 |