Wafer-Scalable Single-Layer Amorphous Molybdenum Trioxide

  • Md Hasibul Alam
  • , Sayema Chowdhury
  • , Anupam Roy
  • , Xiaohan Wu
  • , Ruijing Ge
  • , Michael A. Rodder
  • , Jun Chen
  • , Yang Lu
  • , Chen Stern
  • , Lothar Houben
  • , Robert Chrostowski
  • , Scott R. Burlison
  • , Sung Jin Yang
  • , Martha I. Serna
  • , Ananth Dodabalapur
  • , Filippo Mangolini
  • , Doron Naveh
  • , Jack C. Lee
  • , Sanjay K. Banerjee
  • , Jamie H. Warner
  • Deji Akinwande

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

Molybdenum trioxide (MoO3), an important transition metal oxide (TMO), has been extensively investigated over the past few decades due to its potential in existing and emerging technologies, including catalysis, energy and data storage, electrochromic devices, and sensors. Recently, the growing interest in two-dimensional (2D) materials, often rich in interesting properties and functionalities compared to their bulk counterparts, has led to the investigation of 2D MoO3. However, the realization of large-area true 2D (single to few atom layers thick) MoO3is yet to be achieved. Here, we demonstrate a facile route to obtain wafer-scale monolayer amorphous MoO3using 2D MoS2as a starting material, followed by UV-ozone oxidation at a substrate temperature as low as 120 °C. This simple yet effective process yields smooth, continuous, uniform, and stable monolayer oxide with wafer-scale homogeneity, as confirmed by several characterization techniques, including atomic force microscopy, numerous spectroscopy methods, and scanning transmission electron microscopy. Furthermore, using the subnanometer MoO3as the active layer sandwiched between two metal electrodes, we demonstrate the thinnest oxide-based nonvolatile resistive switching memory with a low voltage operation and a high ON/OFF ratio. These results (potentially extendable to other TMOs) will enable further exploration of subnanometer stoichiometric MoO3, extending the frontiers of ultrathin flexible oxide materials and devices.

Original languageEnglish
Pages (from-to)3756-3767
Number of pages12
JournalACS Nano
Volume16
Issue number3
DOIs
StatePublished - 22 Mar 2022

Bibliographical note

Publisher Copyright:
© 2022 American Chemical Society. All rights reserved.

Funding

D.A. acknowledges the PECASE award from the Army Research Office (ARO) grant #W911NF-16-1-0277 and the National Science Foundation (NSF) MRSEC Center (DMR-172059). S.K.B. acknowledges support from ARO grant #W911NF-17-1-0312 (MURI) and the NSF NASCENT ERC. The development of the XPS peak fitting model was supported by the Laboratory Directed Research and Development program at Sandia National Laboratories, a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc. for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. The work was partly done at the Texas Nanofabrication Facility supported by NSF grant #NNCI-1542159. The authors would like to thank Haoyue Zhu, Tanushree H. Choudhury, and Joan M. Redwing of 2D Crystal Consortium-Materials Innovation Platform (2DCC-MIP) which is funded by the NSF cooperative agreements DMR-1539916 and DMR-2039351 at Penn State University, for providing the wafer-scale MoS samples. In addition, the authors would like to thank Kun Li of Microelectronics Research Center for taking the optical micrograph of the sapphire wafers. The authors also thank Jo Wozniak of the Texas Advanced Computing Center (TACC) for helping with the three-dimensional renderings. 2

FundersFunder number
NSF NASCENT ERC
National Science FoundationDMR-172059, 911NF-17-1-0312
U.S. Department of Energy
Army Research Office911NF-16-1-0277
National Nuclear Security AdministrationDMR-1539916, DE-NA0003525, DMR-2039351, -1542159
Sandia National Laboratories
Laboratory Directed Research and Development
Pennsylvania State University
Multidisciplinary University Research Initiative

    Keywords

    • amorphous
    • molybdenum oxide
    • monolayer
    • resistive switching memory
    • wafer-scale

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