Abstract
Molybdenum trioxide (MoO3), an important transition metal oxide (TMO), has been extensively investigated over the past few decades due to its potential in existing and emerging technologies, including catalysis, energy and data storage, electrochromic devices, and sensors. Recently, the growing interest in two-dimensional (2D) materials, often rich in interesting properties and functionalities compared to their bulk counterparts, has led to the investigation of 2D MoO3. However, the realization of large-area true 2D (single to few atom layers thick) MoO3is yet to be achieved. Here, we demonstrate a facile route to obtain wafer-scale monolayer amorphous MoO3using 2D MoS2as a starting material, followed by UV-ozone oxidation at a substrate temperature as low as 120 °C. This simple yet effective process yields smooth, continuous, uniform, and stable monolayer oxide with wafer-scale homogeneity, as confirmed by several characterization techniques, including atomic force microscopy, numerous spectroscopy methods, and scanning transmission electron microscopy. Furthermore, using the subnanometer MoO3as the active layer sandwiched between two metal electrodes, we demonstrate the thinnest oxide-based nonvolatile resistive switching memory with a low voltage operation and a high ON/OFF ratio. These results (potentially extendable to other TMOs) will enable further exploration of subnanometer stoichiometric MoO3, extending the frontiers of ultrathin flexible oxide materials and devices.
| Original language | English |
|---|---|
| Pages (from-to) | 3756-3767 |
| Number of pages | 12 |
| Journal | ACS Nano |
| Volume | 16 |
| Issue number | 3 |
| DOIs | |
| State | Published - 22 Mar 2022 |
Bibliographical note
Publisher Copyright:© 2022 American Chemical Society. All rights reserved.
Funding
D.A. acknowledges the PECASE award from the Army Research Office (ARO) grant #W911NF-16-1-0277 and the National Science Foundation (NSF) MRSEC Center (DMR-172059). S.K.B. acknowledges support from ARO grant #W911NF-17-1-0312 (MURI) and the NSF NASCENT ERC. The development of the XPS peak fitting model was supported by the Laboratory Directed Research and Development program at Sandia National Laboratories, a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc. for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. The work was partly done at the Texas Nanofabrication Facility supported by NSF grant #NNCI-1542159. The authors would like to thank Haoyue Zhu, Tanushree H. Choudhury, and Joan M. Redwing of 2D Crystal Consortium-Materials Innovation Platform (2DCC-MIP) which is funded by the NSF cooperative agreements DMR-1539916 and DMR-2039351 at Penn State University, for providing the wafer-scale MoS samples. In addition, the authors would like to thank Kun Li of Microelectronics Research Center for taking the optical micrograph of the sapphire wafers. The authors also thank Jo Wozniak of the Texas Advanced Computing Center (TACC) for helping with the three-dimensional renderings. 2
| Funders | Funder number |
|---|---|
| NSF NASCENT ERC | |
| National Science Foundation | DMR-172059, 911NF-17-1-0312 |
| U.S. Department of Energy | |
| Army Research Office | 911NF-16-1-0277 |
| National Nuclear Security Administration | DMR-1539916, DE-NA0003525, DMR-2039351, -1542159 |
| Sandia National Laboratories | |
| Laboratory Directed Research and Development | |
| Pennsylvania State University | |
| Multidisciplinary University Research Initiative |
Keywords
- amorphous
- molybdenum oxide
- monolayer
- resistive switching memory
- wafer-scale
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