Usage of laser timing probe for sensing of programmed charges in EEPROM devices

Liron Bidani; Oded Baharav; Moshe Sinvani; Zeev Zalevsky

doi:10.1109/tdmr.2013.2272218

Usage of laser timing probe for sensing of programmed charges in EEPROM devices

Liron Bidani
, Oded Baharav
, Moshe Sinvani
, Zeev Zalevsky

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A method to measure programmed charges in EEPROM devices is presented. The measurement of the charges was made with subtraction of images captured using a laser timing probe. The effect of the charges is expressed over the captured images due to the plasma dispersion effect.

Original language	English
Article number	6557018
Pages (from-to)	304-310
Number of pages	7
Journal	IEEE Transactions on Device and Materials Reliability
Volume	14
Issue number	1
DOIs	https://doi.org/10.1109/tdmr.2013.2272218
State	Published - Mar 2014

Keywords

Measurement by laser beam
Optics
measurements technique
microscopy

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10.1109/tdmr.2013.2272218

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title = "Usage of laser timing probe for sensing of programmed charges in EEPROM devices",

abstract = "A method to measure programmed charges in EEPROM devices is presented. The measurement of the charges was made with subtraction of images captured using a laser timing probe. The effect of the charges is expressed over the captured images due to the plasma dispersion effect.",

keywords = "Measurement by laser beam, Optics, measurements technique, microscopy",

author = "Liron Bidani and Oded Baharav and Moshe Sinvani and Zeev Zalevsky",

year = "2014",

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doi = "10.1109/tdmr.2013.2272218",

language = "אנגלית",

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AU - Bidani, Liron

AU - Baharav, Oded

AU - Sinvani, Moshe

AU - Zalevsky, Zeev

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N2 - A method to measure programmed charges in EEPROM devices is presented. The measurement of the charges was made with subtraction of images captured using a laser timing probe. The effect of the charges is expressed over the captured images due to the plasma dispersion effect.

AB - A method to measure programmed charges in EEPROM devices is presented. The measurement of the charges was made with subtraction of images captured using a laser timing probe. The effect of the charges is expressed over the captured images due to the plasma dispersion effect.

KW - Measurement by laser beam

KW - Optics

KW - measurements technique

KW - microscopy

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JO - IEEE Transactions on Device and Materials Reliability

JF - IEEE Transactions on Device and Materials Reliability

IS - 1

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ER -

Usage of laser timing probe for sensing of programmed charges in EEPROM devices

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