Ultrafast scanning probe microscopy

S. Weiss; D. F. Ogletree; D. Botkin; M. Salmeron; D. S. Chemla

doi:10.1063/1.110435

Ultrafast scanning probe microscopy

S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron, D. S. Chemla

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Abstract

We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-Å spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.

Original language	English
Pages (from-to)	2567-2569
Number of pages	3
Journal	Applied Physics Letters
Volume	63
Issue number	18
DOIs	https://doi.org/10.1063/1.110435
State	Published - 1993
Externally published	Yes

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10.1063/1.110435

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title = "Ultrafast scanning probe microscopy",

abstract = "We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-{\AA} spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.",

author = "S. Weiss and Ogletree, {D. F.} and D. Botkin and M. Salmeron and Chemla, {D. S.}",

year = "1993",

doi = "10.1063/1.110435",

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AB - We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-Å spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.

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Ultrafast scanning probe microscopy

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