Ultrafast scanning probe microscopy

D. Botkin, S. Weiss, D. F. Ogletree, M. Salmeron, D. S. Chemla

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

We have developed a general technique which combines the temporal resolution of ultrafast laser spectroscopy with the spatial resolution of scanned probe microscopy (SPM). Using this technique with scanning tunneling microscopy (STM), we have obtained simultaneous 2 ps time resolution and 50 A spatial resolution. This improves the time resolution currently attainable with STM by nine orders of magnitude. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution is discussed.

Original languageEnglish
Pages (from-to)376-382
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2116
DOIs
StatePublished - 16 May 1994
Externally publishedYes
EventGeneration, Amplification, and Measurement of Ultrashort Laser Pulses 1994 - Los Angeles, United States
Duration: 23 Jan 199429 Jan 1994

Bibliographical note

Publisher Copyright:
© 1994 SPIE. All rights reserved.

Funding

The authors would like to thank J. Beeman for tremendous help with tip fabrication. This work was supported by a Laboratory Directed Research and Development grant from the Lawrence Berkeley Laboratory, under the US Department of Energy, contract DE-AC03-76SF00098 and by ONR/DARPA under contract #NOO0-14.93.105.36 The authors would like to thank J. Beeman for tremendous help with tip fabrication. This work was supported by a Laboratory Directed Research and Development grant from the Lawrence Berkeley Laboratory, under the US Department of Energy, contract DE-ACO3- 765F00098 and by ONRIDARPA under contract #N000-14.93.105.36

FundersFunder number
ONR/DARPA0-14.93.105.36
ONRIDARPA000-14.93.105.36
US Department of EnergyDE-ACO3- 765F00098
Lawrence Berkeley National Laboratory
Laboratory Directed Research and Development

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