Tracking nanoscale perturbation in active disordered media

Renu Yadav, Patrick Sebbah, Maruthi M. Brundavanam, Shivakiran Bhaktha B. N

Research output: Contribution to journalArticlepeer-review


Disorder-induced feedback makes random lasers very susceptible to any changes in the scattering medium. The sensitivity of the lasing modes to perturbations in the disordered systems has been utilized to map the regions of perturbation. A tracking parameter that takes into account the cumulative effect of changes in the spatial distribution of the lasing modes of the system has been defined to locate the region in which a scatterer is displaced by a few nanometers. We show numerically that the precision of the method increases with the number of modes. The proposed method opens up the possibility of application of random lasers as a tool for monitoring locations of nanoscale displacement, which can be useful for single-particle detection and monitoring.

Original languageEnglish
Article number023513
JournalPhysical Review A
Issue number2
StatePublished - Feb 2023

Bibliographical note

Funding Information:
The authors acknowledge Jonathan Andreasen, Georgia Tech Research Institute, and Anirban Sarkar, National Institute of Technology, Calicut, for fruitful discussions and help in computation. We acknowledge support from the Science and Engineering Research Board via sponsered Project No. CRG/2020/002650. The DST-FIST facility, Department of Physics, IIT Kharagpur, is acknowledged for computational support. We acknowledge the National Supercomputing Mission (NSM) for providing the computing resources of PARAM Shakti at IIT Kharagpur, which is implemented by C-DAC and supported by the Ministry of Electronics and Information Technology (MeitY), Department of Science and Technology (DST), Government of India. The Israel Science Foundation (Grants No. 1871/15, No. 2074/15, and No. 2630/20) and the United States-Israel Binational Science Foundation NSF/BSF (Grants No. 2015694 and No. 2021811) are acknowledged.

Publisher Copyright:
© 2023 American Physical Society.


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