TY - JOUR
T1 - Timing-constrained power minimization in VLSI circuits by simultaneous multilayer wire spacing
AU - Moiseev, Konstantin
AU - Wimer, Shmuel
AU - Kolodny, Avinoam
N1 - Publisher Copyright:
© 2014 Elsevier B.V. All rights reserved.
PY - 2015
Y1 - 2015
N2 - Reduction of interconnect delay and interconnect power has become a primary design challenge in recent CMOS technology generations. Spacing between wires can be modified so that line-to-line capacitances will be optimized for minimal power under timing constraints. In this paper, we present a novel algorithm for simultaneous multilayer interconnect spacing that minimizes the total dynamic power dissipation caused by an interconnect, while maximum delay constraints are satisfied. A multidimensional visibility graph is used to represent the problem, and a layout partitioning technique is applied to solve the problem efficiently. The algorithm was evaluated on an industrial microprocessor designed using the 32 nm technology, and it achieved a 5-12% reduction in interconnect switching power.
AB - Reduction of interconnect delay and interconnect power has become a primary design challenge in recent CMOS technology generations. Spacing between wires can be modified so that line-to-line capacitances will be optimized for minimal power under timing constraints. In this paper, we present a novel algorithm for simultaneous multilayer interconnect spacing that minimizes the total dynamic power dissipation caused by an interconnect, while maximum delay constraints are satisfied. A multidimensional visibility graph is used to represent the problem, and a layout partitioning technique is applied to solve the problem efficiently. The algorithm was evaluated on an industrial microprocessor designed using the 32 nm technology, and it achieved a 5-12% reduction in interconnect switching power.
KW - Constrained optimization
KW - Interconnect sizing and spacing
KW - Power-delay optimization
UR - http://www.scopus.com/inward/record.url?scp=84922842122&partnerID=8YFLogxK
U2 - 10.1016/j.vlsi.2014.03.002
DO - 10.1016/j.vlsi.2014.03.002
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AN - SCOPUS:84922842122
SN - 0167-9260
VL - 48
SP - 116
EP - 128
JO - Integration, the VLSI Journal
JF - Integration, the VLSI Journal
IS - 1
ER -