Abstract
Detection of evanescent waves through Near-field Scanning Optical Microscopy (NSOM) has been simulated in the past, using Finite Elements Method (FEM) and 2D advanced simulations of a silicon Schottky diode, shaped as a truncated trapezoid photodetector, and sharing a subwavelength pin hole aperture. Towards enhanced resolution and next applications, the study of polarization’s influence was added to the scanning. The detector has been horizontally shifted across a vertically oriented Gaussian beam while several E-field modes, are projected on the top of the device. Both electrical and electro-optical simulations have been conducted. These results are promising towards the fabrication of a new generation of photodetector devices which can serve for Time-Spectral based Polarization-Encoding for Spatial-Temporal Super-Resolved NSOM Readout, as developed in the study.
| Original language | English |
|---|---|
| Article number | 13089 |
| Journal | Scientific Reports |
| Volume | 9 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Dec 2019 |
Bibliographical note
Publisher Copyright:© 2019, The Author(s).
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