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Tight-ES-TRNG: Improved Construction and Robustness Analysis
Itamar Levi
, Davide Bellizia
, François Xavier Standaert
Bar-Ilan University - The Alexander Kofkin Faculty of Engineering
Computer Engineering
Université catholique de Louvain
Research output
:
Contribution to journal
›
Article
›
peer-review
3
Scopus citations
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Dive into the research topics of 'Tight-ES-TRNG: Improved Construction and Robustness Analysis'. Together they form a unique fingerprint.
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Keyphrases
Tight
100%
Robustness Analysis
100%
True Random number Generator
100%
Construction Stage Analysis
100%
Min-entropy
50%
Phase Jitter
33%
Stochastic Model
16%
High-resolution
16%
Cost Performance
16%
High Performance
16%
Number of Edges
16%
Clock Edge
16%
Supply Voltage
16%
Transient Noise
16%
Design Characteristics
16%
Ring Oscillator
16%
Proposed Design
16%
Supply Voltage Noise
16%
Fuller Distribution
16%
Slow Drift
16%
Repeated Sampling
16%
Entropy Evaluation
16%
External Temperature
16%
Power Supply Transient
16%
SP800-90B
16%
Engineering
Random Number
100%
Transients
16%
Power Supply
16%
Field Programmable Gate Arrays
16%
Stochastic Model
16%
Fine Grain
16%
High Resolution
16%
Supply Voltage
16%
Clock Edge
16%
Computer Science
Random Number Generator
100%
Postprocessing
33%
Ring Oscillator
16%
Power Supply Voltage
16%
Stochastic Model
16%
Biochemistry, Genetics and Molecular Biology
Electric Potential
100%