Three-dimensional mapping and range measurement by means of projected speckle patterns

Javier García; Zeev Zalevsky; Pascuala García-Martínez; Carlos Ferreira; Mina Teicher; Yevgeny Beiderman

doi:10.1364/ao.47.003032

Three-dimensional mapping and range measurement by means of projected speckle patterns

Javier García, Zeev Zalevsky, Pascuala García-Martínez, Carlos Ferreira, Mina Teicher, Yevgeny Beiderman

University of Valencia

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

Abstract

We present a novel approach for three-dimensional (3D) measurements that includes the projection of coherent light through ground glass. Such a projection generates random speckle patterns on the object or on the camera, depending if the configuration is transmissive or reflective. In both cases the spatially random patterns are seen by the sensor. Different spatially random patterns are generated at different planes. The patterns are highly random and not correlated. This low correlation between different patterns is used for both 3D mapping of objects and range finding.

Original language	English
Pages (from-to)	3032-3040
Number of pages	9
Journal	Applied Optics
Volume	47
Issue number	16
DOIs	https://doi.org/10.1364/ao.47.003032
State	Published - 1 Jun 2008

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AU - Teicher, Mina

AU - Beiderman, Yevgeny

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Three-dimensional mapping and range measurement by means of projected speckle patterns

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