Thickness dependence of the resistivity tensor in epitaxial magnetite thin films

N. Naftalis, Y. Shperber, J. A. Moyer, C. H. Ahn, L. Klein

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Abstract

We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe3O4). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness.

Original languageEnglish
Article number043701
JournalJournal of Applied Physics
Volume114
Issue number4
DOIs
StatePublished - 28 Jul 2013

Bibliographical note

Funding Information:
L.K. acknowledges support by the Israel Science Foundation founded by the Israel Academy of Science and Humanities. Work at Yale supported by Grant No. NSF DMR 1119826 (CRISP). We acknowledge useful discussions with E. Shimshoni.

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