Abstract
We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe3O4). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness.
Original language | English |
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Article number | 043701 |
Journal | Journal of Applied Physics |
Volume | 114 |
Issue number | 4 |
DOIs | |
State | Published - 28 Jul 2013 |
Bibliographical note
Funding Information:L.K. acknowledges support by the Israel Science Foundation founded by the Israel Academy of Science and Humanities. Work at Yale supported by Grant No. NSF DMR 1119826 (CRISP). We acknowledge useful discussions with E. Shimshoni.