Thickness dependence of dendritic flux avalanches in YBa2Cu3O7-x films

E. Baruch-El; M. Baziljevich; T. H. Johansen; A. Shaulov; Y. Yeshurun

doi:10.1088/1742-6596/969/1/012042

Thickness dependence of dendritic flux avalanches in YBa₂Cu₃O_7-x films

E. Baruch-El, M. Baziljevich, T. H. Johansen, A. Shaulov, Y. Yeshurun

Research output: Contribution to journal › Conference article › peer-review

5 Scopus citations

Abstract

By implementing a unique magneto-optical system with ultrafast magnetic-field ramping-rate capability (up to 3 kT/s), we have been able to routinely generate and image dendritic flux instabilities in YBa₂Cu₃O_7-x films. In the present work we study the effect of the film thickness on the dendritic instability. Dendritic avalanches in 50-600 nm thick films were magneto-optically imaged at 7 K, after ramping the magnetic field from zero to 60 mT at different rates. The data reveal a remarkable change in flux morphologies between the thin and the thicker films. While the former (50-250 nm) display well-developed dendritic patterns, the latter (350-600 nm) exhibit few avalanches with favored branch directions parallel to the film's edges. Several possible explanations for this behavior are discussed.

Original language	English
Article number	012042
Journal	Journal of Physics: Conference Series
Volume	969
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/969/1/012042
State	Published - 19 Apr 2018
Event	28th International Conference on Low Temperature Physics, LT 2018 - Gothenburg, Sweden Duration: 9 Aug 2017 → 16 Aug 2017

Bibliographical note

Publisher Copyright:
© Published under licence by IOP Publishing Ltd.

Funding

The authors thank Dr. Robert Semerad for preparation of the films and for helpful discussions. We also acknowledge a financial support from the Israel Science Foundation (ISF-164/12) and the Norwegian Research Council.

Funders	Funder number
Israel Science Foundation	ISF-164/12
Norges Forskningsråd

Access to Document

10.1088/1742-6596/969/1/012042

Cite this

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abstract = "By implementing a unique magneto-optical system with ultrafast magnetic-field ramping-rate capability (up to 3 kT/s), we have been able to routinely generate and image dendritic flux instabilities in YBa2Cu3O7-x films. In the present work we study the effect of the film thickness on the dendritic instability. Dendritic avalanches in 50-600 nm thick films were magneto-optically imaged at 7 K, after ramping the magnetic field from zero to 60 mT at different rates. The data reveal a remarkable change in flux morphologies between the thin and the thicker films. While the former (50-250 nm) display well-developed dendritic patterns, the latter (350-600 nm) exhibit few avalanches with favored branch directions parallel to the film's edges. Several possible explanations for this behavior are discussed.",

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