Thickness dependence of dendritic flux avalanches in YBa2Cu3O7-x films

E. Baruch-El, M. Baziljevich, T. H. Johansen, A. Shaulov, Y. Yeshurun

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


By implementing a unique magneto-optical system with ultrafast magnetic-field ramping-rate capability (up to 3 kT/s), we have been able to routinely generate and image dendritic flux instabilities in YBa2Cu3O7-x films. In the present work we study the effect of the film thickness on the dendritic instability. Dendritic avalanches in 50-600 nm thick films were magneto-optically imaged at 7 K, after ramping the magnetic field from zero to 60 mT at different rates. The data reveal a remarkable change in flux morphologies between the thin and the thicker films. While the former (50-250 nm) display well-developed dendritic patterns, the latter (350-600 nm) exhibit few avalanches with favored branch directions parallel to the film's edges. Several possible explanations for this behavior are discussed.

Original languageEnglish
Article number012042
Number of pages7
JournalJournal of Physics: Conference Series
Issue number1
StatePublished - 19 Apr 2018
Event28th International Conference on Low Temperature Physics, LT 2018 - Gothenburg, Sweden
Duration: 9 Aug 201716 Aug 2017

Bibliographical note

Funding Information:
The authors thank Dr. Robert Semerad for preparation of the films and for helpful discussions. We also acknowledge a financial support from the Israel Science Foundation (ISF-164/12) and the Norwegian Research Council.

Publisher Copyright:
© Published under licence by IOP Publishing Ltd.


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