The use of SIMS in quality control and failure analysis of electrodeposited items inspected for hydrogen effects
- E. Kossoy
- , Y. Khoptiar
- , C. Cytermann
- , G. Shemesh
- , H. Katz
- , H. Sheinkopf
- , I. Cohen
- , N. Eliaz
- Materials Division
- Technion-Israel Institute of Technology
- Tel Aviv University
Research output: Contribution to journal › Article › peer-review
25
Scopus
citations