The ultrafast response of a scanning tunneling microscope

S. Weiss; D. Botkin; D. F. Ogletree; M. Salmeron; D. S. Chemla

doi:10.1002/pssb.2221880132

The ultrafast response of a scanning tunneling microscope

S. Weiss
, D. Botkin
, D. F. Ogletree
, M. Salmeron
, D. S. Chemla

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

Abstract

The development of the ultrafast scanning tunneling microscope is reviewed. It is shown that the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse has a capacitive component, the origin of which is quantum mechanical.

Original language	English
Pages (from-to)	343-359
Number of pages	17
Journal	Physica Status Solidi (B): Basic Research
Volume	188
Issue number	1
DOIs	https://doi.org/10.1002/pssb.2221880132
State	Published - 1 Mar 1995
Externally published	Yes

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@article{819664578e554b078e9a4745f8cce0e8,

title = "The ultrafast response of a scanning tunneling microscope",

abstract = "The development of the ultrafast scanning tunneling microscope is reviewed. It is shown that the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse has a capacitive component, the origin of which is quantum mechanical.",

author = "S. Weiss and D. Botkin and Ogletree, \{D. F.\} and M. Salmeron and Chemla, \{D. S.\}",

year = "1995",

month = mar,

day = "1",

doi = "10.1002/pssb.2221880132",

language = "אנגלית",

volume = "188",

pages = "343--359",

journal = "Physica Status Solidi (B): Basic Research",

issn = "0370-1972",

publisher = "John Wiley and Sons Inc.",

number = "1",

}

TY - JOUR

T1 - The ultrafast response of a scanning tunneling microscope

AU - Weiss, S.

AU - Botkin, D.

AU - Ogletree, D. F.

AU - Salmeron, M.

AU - Chemla, D. S.

PY - 1995/3/1

Y1 - 1995/3/1

N2 - The development of the ultrafast scanning tunneling microscope is reviewed. It is shown that the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse has a capacitive component, the origin of which is quantum mechanical.

AB - The development of the ultrafast scanning tunneling microscope is reviewed. It is shown that the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse has a capacitive component, the origin of which is quantum mechanical.

UR - https://www.scopus.com/pages/publications/84990723314

U2 - 10.1002/pssb.2221880132

DO - 10.1002/pssb.2221880132

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:84990723314

SN - 0370-1972

VL - 188

SP - 343

EP - 359

JO - Physica Status Solidi (B): Basic Research

JF - Physica Status Solidi (B): Basic Research

IS - 1

ER -

The ultrafast response of a scanning tunneling microscope

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