Abstract
The development of the ultrafast scanning tunneling microscope is reviewed. It is shown that the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse has a capacitive component, the origin of which is quantum mechanical.
Original language | English |
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Pages (from-to) | 343-359 |
Number of pages | 17 |
Journal | Physica Status Solidi (B): Basic Research |
Volume | 188 |
Issue number | 1 |
DOIs | |
State | Published - 1 Mar 1995 |
Externally published | Yes |