The ultrafast response of a scanning tunneling microscope

S. Weiss, D. Botkin, D. F. Ogletree, M. Salmeron, D. S. Chemla

Research output: Contribution to journalArticlepeer-review

47 Scopus citations

Abstract

The development of the ultrafast scanning tunneling microscope is reviewed. It is shown that the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse has a capacitive component, the origin of which is quantum mechanical.

Original languageEnglish
Pages (from-to)343-359
Number of pages17
JournalPhysica Status Solidi (B): Basic Research
Volume188
Issue number1
DOIs
StatePublished - 1 Mar 1995
Externally publishedYes

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