The structure and composition of the CdSe-(Oxidized titanium) interface: An investigation by transmission electron microscopy and electron diffraction

Ana Albu-Yaron; D. Cahen; G. Hodes

doi:10.1016/0040-6090(84)90462-0

The structure and composition of the CdSe-(Oxidized titanium) interface: An investigation by transmission electron microscopy and electron diffraction

Ana Albu-Yaron, D. Cahen, G. Hodes

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Transmission electron microscopy and electron diffraction techniques were used to investigate the composition and structure of the interface layer between polycrystalline CdSe films (prepared by slurry painting or electrodeposition) and oxidized titanium substrates used as photoelectrodes. The findings were correlated with the adhesion of the layers. Compound formation between the CdSe and TiO₂ (the main constituent of the oxidized titanium surface) was found to occur. In samples which showed good adhesion, CdTi intermetallic compounds and oxides were generally found; these compounds were absent in samples exhibiting poor adhesion.

Original language	English
Pages (from-to)	349-358
Number of pages	10
Journal	Thin Solid Films
Volume	112
Issue number	4
DOIs	https://doi.org/10.1016/0040-6090(84)90462-0
State	Published - 24 Feb 1984
Externally published	Yes

Funding

We thankD r. L. J. Brillson foer nlightenincgo mmentdsu ringt hec ourseo f this work. This researchw as supportedin part by a grant from the U.S.-Israel BinationaSl cienceF oundationJ,e rusalemI,s rael.

Funders	Funder number
U.S.-Israel BinationaSl cienceF oundationJ

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The structure and composition of the CdSe-(Oxidized titanium) interface: An investigation by transmission electron microscopy and electron diffraction

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