Abstract
We measured on the dielectric side, with |N/Nc - 1| ≤ 0.64 the critical indices of the metal-insulator transition (MIT) in n-Ge with low (1.4 and 12%) and medium (38 and 54%) compensation, prepared by neutron-transmutation doping (NTD) of isotopic mixtures of 74Ge and 70Ge. We analyzed from the temperature dependence of hopping resistance in the variable-range hopping (VRH) regime with Coulomb gap the scaling of the localization length a, and of the dielectric constant N. At low compensation we find that the critical indices are ν ≈ 1/2, ζ ≈ 1, which increase up to ν ≈ 1, ζ ≈ 2, for medium compensations.
| Original language | English |
|---|---|
| Pages (from-to) | 269-273 |
| Number of pages | 5 |
| Journal | Physica Status Solidi (B): Basic Research |
| Volume | 205 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 1998 |
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