The roughness and growth of a silver-mercury reaction interface

Avraham Be'er, Yossi Lereah, Inbal Hecht, Haim Taitelbaum

Research output: Contribution to journalConference articlepeer-review

16 Scopus citations

Abstract

The spreading of small droplets (50-200 μm) of Hg on thin Ag films has been studied, using optical microscope, scanning electron microscope (SEM) and atomic force microscope (AFM). The growing rough surfaces have been analyzed in order to determine the roughness (α) and growth (β) exponents. For Ag thickness of 500-2000 Å we have found that α = 0.66±0.03 and β = 0.46±0.02, while for Ag thickness of 0.1 mm, α = 0.77±0.04 and β = 0.60±0.02. Both sets of exponents satisfy the scaling relation α + α/β = 2. In both systems the roughness exponent α crosses over to 0.5 in the final stages of the experiment and for relatively long length scales (order of a few μm).

Original languageEnglish
Pages (from-to)297-301
Number of pages5
JournalPhysica A: Statistical Mechanics and its Applications
Volume302
Issue number1-4
DOIs
StatePublished - 15 Dec 2001
EventInternational Workshop on Frontiers in the Physics of Complex Systems - Ramat-Gan, Israel
Duration: 25 Mar 200128 Mar 2001

Bibliographical note

Funding Information:
To summarize, we have presented data on the geometry and dynamics of a silver–mercury reaction interface. We have calculated the roughness and growth exponents and discussed the corresponding universality classes. The results are summarized in Table 1 . The crossover behavior of the roughness exponent sheds light on different mechanisms and correlation lengths in the process. This research was supported by The Israel Science Foundation, and is a part of the Ph.D. research of A. Be’er and I. Hecht.

Keywords

  • Diffusion
  • Interface
  • Reaction
  • Surface growth
  • Wetting

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