The Roughness and Growth of a Silver-Mercury Reaction Interface

A Be'er, Y Lereah, I Hecht, H. Taitelbaum

Research output: Contribution to journalArticlepeer-review


The spreading of small droplets (50–Full-size image (<1 K) of Hg on thin Ag films has been studied, using optical microscope, scanning electron microscope (SEM) and atomic force microscope (AFM). The growing rough surfaces have been analyzed in order to determine the roughness (α) and growth (β) exponents. For Ag thickness of 500–Full-size image (<1 K) we have found that α=0.66±0.03 and β=0.46±0.02, while for Ag thickness of Full-size image (<1 K), α=0.77±0.04 and β=0.60±0.02. Both sets of exponents satisfy the scaling relation α+α/β=2. In both systems the roughness exponent α crosses over to 0.5 in the final stages of the experiment and for relatively long length scales (order of a few μm).
Original languageAmerican English
Pages (from-to)297-301
JournalPhysica A: Statistical Mechanics and its Applications
StatePublished - 2001


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