The Raman spectroscopy of neutron transmutation doping isotope 74Germanium nanocrystals embedded in SiO2 matrix

Youwen Hu; Tiecheng Lu; Shaobo Dun; Qiang Hu; Ningkang Huang; Songbao Zhang; Bin Tang; Junlong Dai; Lev Resnick; Issai Shlimak; Sha Zhu; Qiangmin Wei; Lumin Wang

doi:10.1016/j.ssc.2006.12.001

The Raman spectroscopy of neutron transmutation doping isotope ⁷⁴Germanium nanocrystals embedded in SiO₂ matrix

Youwen Hu, Tiecheng Lu, Shaobo Dun, Qiang Hu, Ningkang Huang, Songbao Zhang, Bin Tang, Junlong Dai, Lev Resnick, Issai Shlimak, Sha Zhu, Qiangmin Wei, Lumin Wang

Department of Physics - at Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

We have succeeded in doping arsenic (As) impurities into isotope germanium nanocrystals (nc-⁷⁴Ge) uniformly dispersed in a SiO₂ matrix by using the neutron transmutation doping (NTD) method. The samples' inner structural transmutation is studied by combining Raman scattering, X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS) and Transmission electron microscope (TEM) methods. The Raman spectrum of the doped sample exhibits a relative intensity increase of the low frequency tail, blue shift of the main Raman peak (∼300 cm^-1) and a high frequency tail, while the undoped sample does not. Together with the XRF, XPS and TEM, we believe that the relative intensity increase of the low frequency tail arises from an increase of amorphous ⁷⁴Ge (a-⁷⁴Ge) induced by the irradiation damage. The blue shift of the main Raman peak comes from the mismatch of the crystal lattice which arose from the As impurity introduction. And the high frequency tail is due to transmuted-impurities (As) in the nc-⁷⁴Ge which was introduced by NTD.

Original language	English
Pages (from-to)	514-518
Number of pages	5
Journal	Solid State Communications
Volume	141
Issue number	9
DOIs	https://doi.org/10.1016/j.ssc.2006.12.001
State	Published - Mar 2007

Bibliographical note

Funding Information:
This research is supported by grant 3-405 from the Ministry of Science and Technology, Israel, within the cooperation program with the State Science Technology Commission China, NASF of NSFC-CAEP of PR China under grant number 10376020, as well as the Program for New Century Excellent Talents in Universities (No. NCET-04-0874), China. The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for financial support.

Funding

This research is supported by grant 3-405 from the Ministry of Science and Technology, Israel, within the cooperation program with the State Science Technology Commission China, NASF of NSFC-CAEP of PR China under grant number 10376020, as well as the Program for New Century Excellent Talents in Universities (No. NCET-04-0874), China. The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for financial support.

Funders	Funder number
NASF
NSFC-CAEP of PR China	10376020
State Science Technology Commission China
Program for New Century Excellent Talents in University	NCET-04-0874
Ministry of science and technology, Israel

Keywords

A. Isotope Ge nanocrystals
B. Transmuted impurities
E. Laser Raman scattering
E. Neutron transmutation doping

Access to Document

10.1016/j.ssc.2006.12.001

Cite this

@article{180df93373ca4bdcb2325070412b6c60,

title = "The Raman spectroscopy of neutron transmutation doping isotope 74Germanium nanocrystals embedded in SiO2 matrix",

abstract = "We have succeeded in doping arsenic (As) impurities into isotope germanium nanocrystals (nc-74Ge) uniformly dispersed in a SiO2 matrix by using the neutron transmutation doping (NTD) method. The samples' inner structural transmutation is studied by combining Raman scattering, X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS) and Transmission electron microscope (TEM) methods. The Raman spectrum of the doped sample exhibits a relative intensity increase of the low frequency tail, blue shift of the main Raman peak (∼300 cm-1) and a high frequency tail, while the undoped sample does not. Together with the XRF, XPS and TEM, we believe that the relative intensity increase of the low frequency tail arises from an increase of amorphous 74Ge (a-74Ge) induced by the irradiation damage. The blue shift of the main Raman peak comes from the mismatch of the crystal lattice which arose from the As impurity introduction. And the high frequency tail is due to transmuted-impurities (As) in the nc-74Ge which was introduced by NTD.",

keywords = "A. Isotope Ge nanocrystals, B. Transmuted impurities, E. Laser Raman scattering, E. Neutron transmutation doping",

author = "Youwen Hu and Tiecheng Lu and Shaobo Dun and Qiang Hu and Ningkang Huang and Songbao Zhang and Bin Tang and Junlong Dai and Lev Resnick and Issai Shlimak and Sha Zhu and Qiangmin Wei and Lumin Wang",

note = "Funding Information: This research is supported by grant 3-405 from the Ministry of Science and Technology, Israel, within the cooperation program with the State Science Technology Commission China, NASF of NSFC-CAEP of PR China under grant number 10376020, as well as the Program for New Century Excellent Talents in Universities (No. NCET-04-0874), China. The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for financial support.",

year = "2007",

month = mar,

doi = "10.1016/j.ssc.2006.12.001",

language = "אנגלית",

volume = "141",

pages = "514--518",

journal = "Solid State Communications",

issn = "0038-1098",

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TY - JOUR

T1 - The Raman spectroscopy of neutron transmutation doping isotope 74Germanium nanocrystals embedded in SiO2 matrix

AU - Hu, Youwen

AU - Lu, Tiecheng

AU - Dun, Shaobo

AU - Hu, Qiang

AU - Huang, Ningkang

AU - Zhang, Songbao

AU - Tang, Bin

AU - Dai, Junlong

AU - Resnick, Lev

AU - Shlimak, Issai

AU - Zhu, Sha

AU - Wei, Qiangmin

AU - Wang, Lumin

N1 - Funding Information: This research is supported by grant 3-405 from the Ministry of Science and Technology, Israel, within the cooperation program with the State Science Technology Commission China, NASF of NSFC-CAEP of PR China under grant number 10376020, as well as the Program for New Century Excellent Talents in Universities (No. NCET-04-0874), China. The authors thank A.N. Ionov and I. Lazebnik for their help in sample irradiation with a neutron flux in a research nuclear reactor. L.R. and I.S. are thankful to the Erick and Sheila Samson Chair of Semiconductor Technology for financial support.

PY - 2007/3

Y1 - 2007/3

N2 - We have succeeded in doping arsenic (As) impurities into isotope germanium nanocrystals (nc-74Ge) uniformly dispersed in a SiO2 matrix by using the neutron transmutation doping (NTD) method. The samples' inner structural transmutation is studied by combining Raman scattering, X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS) and Transmission electron microscope (TEM) methods. The Raman spectrum of the doped sample exhibits a relative intensity increase of the low frequency tail, blue shift of the main Raman peak (∼300 cm-1) and a high frequency tail, while the undoped sample does not. Together with the XRF, XPS and TEM, we believe that the relative intensity increase of the low frequency tail arises from an increase of amorphous 74Ge (a-74Ge) induced by the irradiation damage. The blue shift of the main Raman peak comes from the mismatch of the crystal lattice which arose from the As impurity introduction. And the high frequency tail is due to transmuted-impurities (As) in the nc-74Ge which was introduced by NTD.

AB - We have succeeded in doping arsenic (As) impurities into isotope germanium nanocrystals (nc-74Ge) uniformly dispersed in a SiO2 matrix by using the neutron transmutation doping (NTD) method. The samples' inner structural transmutation is studied by combining Raman scattering, X-ray fluorescence (XRF), X-ray photoelectron spectroscopy (XPS) and Transmission electron microscope (TEM) methods. The Raman spectrum of the doped sample exhibits a relative intensity increase of the low frequency tail, blue shift of the main Raman peak (∼300 cm-1) and a high frequency tail, while the undoped sample does not. Together with the XRF, XPS and TEM, we believe that the relative intensity increase of the low frequency tail arises from an increase of amorphous 74Ge (a-74Ge) induced by the irradiation damage. The blue shift of the main Raman peak comes from the mismatch of the crystal lattice which arose from the As impurity introduction. And the high frequency tail is due to transmuted-impurities (As) in the nc-74Ge which was introduced by NTD.

KW - A. Isotope Ge nanocrystals

KW - B. Transmuted impurities

KW - E. Laser Raman scattering

KW - E. Neutron transmutation doping

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