The effect of line defects on the uniformity of nucleation on a substrate

V. Halpern

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

It is shown that a line of capture sites on a substrate substantially reduces the density of stable clusters in a region near it whose width is approximately half of the diffusion length of the adsorbed atoms.

Original languageEnglish
Pages (from-to)2-3
Number of pages2
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume32
Issue number1
DOIs
StatePublished - 1 Jun 1970

Bibliographical note

Funding Information:
We tank Professor H. Wergeland for his kind hospitality at N.T.H.. Trondheim. A postdoctoral fellowship of the Royal Norwegian Council for Scientific and Industrial Research is gratefully acknowledged.

Fingerprint

Dive into the research topics of 'The effect of line defects on the uniformity of nucleation on a substrate'. Together they form a unique fingerprint.

Cite this