Abstract
The results of different experimental techniques for measuring the density of localised states in amorphous semiconductors are often found to differ quantitatively, and sometimes even qualitatively. One possible reason for these differences is that the material is inhomogeneous, and the inhomogeneities have different effects on the results of different types of measurement. The effects of two common types of inhomogeneity on the results of various types of experiments is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 351-354 |
| Number of pages | 4 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 77-78 |
| Issue number | PART 1 |
| DOIs | |
| State | Published - 2 Dec 1985 |
Fingerprint
Dive into the research topics of 'The density of localised states relevant to different properties of inhomogeneous amorphous semiconductors'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver