TY - JOUR
T1 - The density of localised states relevant to different properties of inhomogeneous amorphous semiconductors
AU - Halpern, V.
PY - 1985/12/2
Y1 - 1985/12/2
N2 - The results of different experimental techniques for measuring the density of localised states in amorphous semiconductors are often found to differ quantitatively, and sometimes even qualitatively. One possible reason for these differences is that the material is inhomogeneous, and the inhomogeneities have different effects on the results of different types of measurement. The effects of two common types of inhomogeneity on the results of various types of experiments is discussed.
AB - The results of different experimental techniques for measuring the density of localised states in amorphous semiconductors are often found to differ quantitatively, and sometimes even qualitatively. One possible reason for these differences is that the material is inhomogeneous, and the inhomogeneities have different effects on the results of different types of measurement. The effects of two common types of inhomogeneity on the results of various types of experiments is discussed.
UR - http://www.scopus.com/inward/record.url?scp=0022227084&partnerID=8YFLogxK
U2 - 10.1016/0022-3093(85)90673-8
DO - 10.1016/0022-3093(85)90673-8
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AN - SCOPUS:0022227084
SN - 0022-3093
VL - 77-78
SP - 351
EP - 354
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
IS - PART 1
ER -