The characterization of polymer biodegradation by in situ atomic force microscopy and surface plasmon resonance analysis

K. M. Shakesheff; X. Chen; M. C. Davies; A. Domb; J. Heller; C. J. Roberts; S. J.B. Tendler; P. M. Williams

The characterization of polymer biodegradation by in situ atomic force microscopy and surface plasmon resonance analysis

K. M. Shakesheff, X. Chen, M. C. Davies, A. Domb, J. Heller, C. J. Roberts, S. J.B. Tendler, P. M. Williams

University of Nottingham

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	384-385
Number of pages	2
Journal	Proceedings of the Controlled Release Society
Issue number	22
State	Published - 1995
Externally published	Yes

Cite this

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title = "The characterization of polymer biodegradation by in situ atomic force microscopy and surface plasmon resonance analysis",

author = "Shakesheff, {K. M.} and X. Chen and Davies, {M. C.} and A. Domb and J. Heller and Roberts, {C. J.} and Tendler, {S. J.B.} and Williams, {P. M.}",

year = "1995",

language = "אנגלית",

pages = "384--385",

journal = "Proceedings of the Controlled Release Society",

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AU - Shakesheff, K. M.

AU - Chen, X.

AU - Davies, M. C.

AU - Domb, A.

AU - Heller, J.

AU - Roberts, C. J.

AU - Tendler, S. J.B.

AU - Williams, P. M.

PY - 1995

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EP - 385

JO - Proceedings of the Controlled Release Society

JF - Proceedings of the Controlled Release Society

IS - 22

ER -

The characterization of polymer biodegradation by in situ atomic force microscopy and surface plasmon resonance analysis

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