Testing concepts of advanced rad-hard SoC

Keyphrases

• Test Coverage 100%
• System-on-chip 100%
• Rad-hard 100%
• Hard Systems 100%
• Testing Concept 100%
• Failure Mechanism 66%
• Testability 66%
• High Voltage Stress 66%
• System-on-Chip Devices 66%
• Space Systems 33%
• High Performance 33%
• Design Requirements 33%
• High Power 33%
• Pattern-based 33%
• Screening Method 33%
• Advanced Systems 33%
• Memory Access 33%
• Space Application 33%
• High Reliability 33%
• Soft Error 33%
• Radiation Effects 33%
• Gate Count 33%
• High Integration 33%
• Production Test 33%
• Conventional Test 33%
• Integration Level 33%
• Test Pattern 33%
• Functional Failure 33%
• Count Size 33%
• Die Size 33%
• Efficient Screening 33%

Engineering

• System-on-Chip 100%
• Chip Device 66%
• Failure Mechanism 66%
• Testability 66%
• Early Stage 33%
• Internals 33%
• Soft Error 33%
• Key Concept 33%
• Space System 33%
• Radiation Effect 33%
• Space Application 33%
• Memory Access 33%