Testing and failure analysis methodology of the NS32532 microprocessor

E. Shihadeh; M. Beck; D. Biran; Y. Hoffman; T. Liran; B. Maytal; Y. Milstein; R. Nasrallah; Y. Nevo

doi:10.1109/cicc.1989.56813

Testing and failure analysis methodology of the NS32532 microprocessor

E. Shihadeh, M. Beck, D. Biran, Y. Hoffman, T. Liran, B. Maytal, Y. Milstein, R. Nasrallah, Y. Nevo

National Semiconductor Corporation

Research output: Contribution to journal › Conference article › peer-review

Abstract

In this paper we describe our methodology for testing the NS32532 microprocessor to increase the yield and reliability, which is based on an intensive use of test data collection, continuous use of data analysis and various failure analysis methods, some of them are represented.

Original language	English
Article number	5726280
Pages (from-to)	22.7.1-22.7.4
Journal	Proceedings of the Custom Integrated Circuits Conference
DOIs	https://doi.org/10.1109/cicc.1989.56813
State	Published - 1989
Externally published	Yes
Event	11th IEEE 1989 Custom Integrated Circuits Conference, CICC'89 - San Diego, CA, United States Duration: 15 May 1989 → 18 May 1989

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10.1109/cicc.1989.56813

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title = "Testing and failure analysis methodology of the NS32532 microprocessor",

abstract = "In this paper we describe our methodology for testing the NS32532 microprocessor to increase the yield and reliability, which is based on an intensive use of test data collection, continuous use of data analysis and various failure analysis methods, some of them are represented.",

author = "E. Shihadeh and M. Beck and D. Biran and Y. Hoffman and T. Liran and B. Maytal and Y. Milstein and R. Nasrallah and Y. Nevo",

year = "1989",

doi = "10.1109/cicc.1989.56813",

language = "אנגלית",

pages = "22.7.1--22.7.4",

journal = "Proceedings of the Custom Integrated Circuits Conference",

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note = "11th IEEE 1989 Custom Integrated Circuits Conference, CICC'89 ; Conference date: 15-05-1989 Through 18-05-1989",

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AU - Shihadeh, E.

AU - Beck, M.

AU - Biran, D.

AU - Hoffman, Y.

AU - Liran, T.

AU - Maytal, B.

AU - Milstein, Y.

AU - Nasrallah, R.

AU - Nevo, Y.

PY - 1989

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N2 - In this paper we describe our methodology for testing the NS32532 microprocessor to increase the yield and reliability, which is based on an intensive use of test data collection, continuous use of data analysis and various failure analysis methods, some of them are represented.

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DO - 10.1109/cicc.1989.56813

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JF - Proceedings of the Custom Integrated Circuits Conference

M1 - 5726280

T2 - 11th IEEE 1989 Custom Integrated Circuits Conference, CICC'89

Y2 - 15 May 1989 through 18 May 1989

ER -

Testing and failure analysis methodology of the NS32532 microprocessor

Abstract

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