Testing and failure analysis methodology of the NS32532 microprocessor

Keyphrases

• Microprocessor 100%
• Failure Analysis 100%
• Testing Analysis 100%
• Overall Yield 50%
• Continued Use 50%
• Test Use 50%
• Product Yield 50%
• Intensive Use 50%
• Test Reliability 50%
• Circuit Sensitivity 50%

Computer Science

• Analysis Methodology 100%
• Failure Analysis 100%
• Data Analysis 50%
• Process Problem 50%

Engineering

• Microprocessor Chips 100%
• Failure Analysis 100%
• Test Data 50%
• Reliability Analysis 50%