Testing and failure analysis methodology of the NS32532 microprocessor

E. Shihadeh; M. Beck; D. Biran; Y. Hoffman; T. Liran; B. Maytal; Y. Milstein; R. Nasrallah; Y. Nevo

Testing and failure analysis methodology of the NS32532 microprocessor

E. Shihadeh
, M. Beck
, D. Biran
, Y. Hoffman
, T. Liran
, B. Maytal
, Y. Milstein
, R. Nasrallah
, Y. Nevo

Isr

Research output: Contribution to journal › Conference article › peer-review

Abstract

A methodology is described for testing the NS32532 microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability.

Original language	English
Pages (from-to)	22.7/1-4
Journal	Proceedings of the Custom Integrated Circuits Conference
State	Published - May 1989
Externally published	Yes
Event	Proceedings of the IEEE 1989 Custom Integrated Circuits Conference - San Diego, CA, SA Duration: 15 May 1989 → 18 May 1989

Cite this

@article{d35216ad921b497fb9aa2102da020b46,

title = "Testing and failure analysis methodology of the NS32532 microprocessor",

abstract = "A methodology is described for testing the NS32532 microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability.",

author = "E. Shihadeh and M. Beck and D. Biran and Y. Hoffman and T. Liran and B. Maytal and Y. Milstein and R. Nasrallah and Y. Nevo",

year = "1989",

month = may,

language = "אנגלית",

pages = "22.7/1--4",

journal = "Proceedings of the Custom Integrated Circuits Conference",

issn = "0886-5930",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the IEEE 1989 Custom Integrated Circuits Conference ; Conference date: 15-05-1989 Through 18-05-1989",

}

TY - JOUR

T1 - Testing and failure analysis methodology of the NS32532 microprocessor

AU - Shihadeh, E.

AU - Beck, M.

AU - Biran, D.

AU - Hoffman, Y.

AU - Liran, T.

AU - Maytal, B.

AU - Milstein, Y.

AU - Nasrallah, R.

AU - Nevo, Y.

PY - 1989/5

Y1 - 1989/5

N2 - A methodology is described for testing the NS32532 microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability.

AB - A methodology is described for testing the NS32532 microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability.

UR - https://www.scopus.com/pages/publications/0024663857

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???

AN - SCOPUS:0024663857

SN - 0886-5930

SP - 22.7/1-4

JO - Proceedings of the Custom Integrated Circuits Conference

JF - Proceedings of the Custom Integrated Circuits Conference

T2 - Proceedings of the IEEE 1989 Custom Integrated Circuits Conference

Y2 - 15 May 1989 through 18 May 1989

ER -

Testing and failure analysis methodology of the NS32532 microprocessor

Abstract

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