TY - JOUR
T1 - Testing and failure analysis methodology of the NS32532 microprocessor
AU - Shihadeh, E.
AU - Beck, M.
AU - Biran, D.
AU - Hoffman, Y.
AU - Liran, T.
AU - Maytal, B.
AU - Milstein, Y.
AU - Nasrallah, R.
AU - Nevo, Y.
PY - 1989/5
Y1 - 1989/5
N2 - A methodology is described for testing the NS32532 microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability.
AB - A methodology is described for testing the NS32532 microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability.
UR - http://www.scopus.com/inward/record.url?scp=0024663857&partnerID=8YFLogxK
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AN - SCOPUS:0024663857
SN - 0886-5930
SP - 22.7/1-4
JO - Proceedings of the Custom Integrated Circuits Conference
JF - Proceedings of the Custom Integrated Circuits Conference
T2 - Proceedings of the IEEE 1989 Custom Integrated Circuits Conference
Y2 - 15 May 1989 through 18 May 1989
ER -