Abstract
SnO2 thin films, being n-type semiconductors, have wide application in the field of sensor technology. They are obtained by a wet chemical process, using SnCl2·2H2O as a tin containing precursor. The films thus obtained were subjected to optical, X-ray diffraction (XRD), microstructural, FTIR and Raman studies.
| Original language | English |
|---|---|
| Pages (from-to) | 123-129 |
| Number of pages | 7 |
| Journal | Materials Science-Poland |
| Volume | 27 |
| Issue number | 1 |
| State | Published - 2009 |
| Externally published | Yes |
Keywords
- FTIR
- Raman spectra
- SnO
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