Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor CuInSe2

Larissa Kaplan, Gregory Leitus, Vera Lyakhovitskaya, Felix Frolow, Hanna Hallak, Åke Kvick, David Cahen

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

CuInSe2 single crystals prepared by the traveling heater method were investigated by synchrotron X-ray diffraction. Three sample types were investigated: as-grown, n-type; samples converted to p-type by annealing with Se; and samples subjected to an electric field leading to n+/p/n transistor formation. Clear evidence for the thermally-assisted electromigration mechanism proposed for electric-field induced transistor formation was observed. The observations provide important support for the model of ion migration-mediated self-stabilization of CuInSe2-based solar cells.

Original languageEnglish
Pages (from-to)366-370
Number of pages5
JournalAdvanced Materials
Volume12
Issue number5
DOIs
StatePublished - 2000
Externally publishedYes

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