TY - JOUR
T1 - Surface roughness of water measured by x-ray reflectivity
AU - Braslau, A.
AU - Deutsch, M.
AU - Pershan, P. S.
AU - Weiss, A. H.
AU - Als-Nielsen, J.
AU - Bohr, J.
PY - 1985
Y1 - 1985
N2 - The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation (λ∼1.5 A), the angular dependence of the x-ray reflectivity was measured from grazing incidence (∼0.0021 rad), where the reflectivity was greater than 0.96, to an incident angle of ∼0.05 rad, where the reflectivity was ∼7×10-8. A fit to the data by a theory with only one adjustable parameter obtains 3.2 A for the root-mean-square roughness of the water surface.
AB - The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation (λ∼1.5 A), the angular dependence of the x-ray reflectivity was measured from grazing incidence (∼0.0021 rad), where the reflectivity was greater than 0.96, to an incident angle of ∼0.05 rad, where the reflectivity was ∼7×10-8. A fit to the data by a theory with only one adjustable parameter obtains 3.2 A for the root-mean-square roughness of the water surface.
UR - http://www.scopus.com/inward/record.url?scp=4243122571&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.54.114
DO - 10.1103/PhysRevLett.54.114
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AN - SCOPUS:4243122571
SN - 0031-9007
VL - 54
SP - 114
EP - 117
JO - Physical Review Letters
JF - Physical Review Letters
IS - 2
ER -