Abstract
We demonstrate a novel, simple, and fast superresolution imaging method that is based on blinking of fluorescence emitters and high order statistical analysis.
| Original language | English |
|---|---|
| Journal | Optics InfoBase Conference Papers |
| DOIs | |
| State | Published - 2010 |
| Externally published | Yes |
| Event | Laser Science, LS 2010 - Rochester, NY, United States Duration: 24 Oct 2010 → 28 Oct 2010 |
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