Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing

Vicente Micó; José Ángel Picazo-Bueno; Zeev Zalevsky; Javier García; Carlos Ferreira

doi:10.1117/12.2270396

Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing

Vicente Micó, José Ángel Picazo-Bueno, Zeev Zalevsky, Javier García, Carlos Ferreira

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

University of Valencia

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We report on the merging between our recently introduced SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) technique and superresolution imaging. SMIM has been previously reported [Opt. Express 22, 14929 (2014); J. Bio. Opt. 21, 106007 (2016)] as a low cost, extremely simple, and highly stable scheme to update a standard microscope into a holographic microscope but, as consequence, the usable FOV is reduced. Superresolution capability enables to enhance the resolution limit in the usable FOV thus compensating the FOV reduction. In this contribution, superresolution is implemented joint together with SMIM defining a new method named as S2MIM (initials incoming from Superresolved Spatially Multiplexed Interferometric Microscopy) which updates a commercially available non-holographic microscope into a superresolved holographic one. Experimental validation is presented for an Olympus BX-60 upright microscope with a USAF resolution test target as calibration object.

Original language	English
Title of host publication	Optical Measurement Systems for Industrial Inspection X
Editors	Peter Lehmann, Armando Albertazzi Goncalves, Wolfgang Osten
Publisher	SPIE
ISBN (Electronic)	9781510611030
DOIs	https://doi.org/10.1117/12.2270396
State	Published - 2017
Event	Optical Measurement Systems for Industrial Inspection X 2017 - Munich, Germany Duration: 26 Jun 2017 → 29 Jun 2017

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	10329
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Optical Measurement Systems for Industrial Inspection X 2017
Country/Territory	Germany
City	Munich
Period	26/06/17 → 29/06/17

Bibliographical note

Publisher Copyright:
© 2017 SPIE.

Funding

Part of this work has been funded by the Spanish Ministerio de Economía y Competitividad and the Fondo Europeo de Desarrollo Regional (FEDER) under the project FIS2013-47548-P.

Funders	Funder number
Ministerio de Economía y Competitividad
European Regional Development Fund	FIS2013-47548-P

Keywords

Digital holography
Digital image processing
Interference microscopy
Superresolution
Synthetic aperture generation

Access to Document

10.1117/12.2270396

Cite this

Micó, V., Picazo-Bueno, J. Á., Zalevsky, Z., García, J., & Ferreira, C. (2017). Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing. In P. Lehmann, A. A. Goncalves, & W. Osten (Eds.), Optical Measurement Systems for Industrial Inspection X Article 103294C (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10329). SPIE. https://doi.org/10.1117/12.2270396

Micó, Vicente ; Picazo-Bueno, José Ángel ; Zalevsky, Zeev et al. / Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing. Optical Measurement Systems for Industrial Inspection X. editor / Peter Lehmann ; Armando Albertazzi Goncalves ; Wolfgang Osten. SPIE, 2017. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{6be8e559b9404687b4e457e22602a7d9,

title = "Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing",

abstract = "We report on the merging between our recently introduced SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) technique and superresolution imaging. SMIM has been previously reported [Opt. Express 22, 14929 (2014); J. Bio. Opt. 21, 106007 (2016)] as a low cost, extremely simple, and highly stable scheme to update a standard microscope into a holographic microscope but, as consequence, the usable FOV is reduced. Superresolution capability enables to enhance the resolution limit in the usable FOV thus compensating the FOV reduction. In this contribution, superresolution is implemented joint together with SMIM defining a new method named as S2MIM (initials incoming from Superresolved Spatially Multiplexed Interferometric Microscopy) which updates a commercially available non-holographic microscope into a superresolved holographic one. Experimental validation is presented for an Olympus BX-60 upright microscope with a USAF resolution test target as calibration object.",

keywords = "Digital holography, Digital image processing, Interference microscopy, Superresolution, Synthetic aperture generation",

author = "Vicente Mic{\'o} and Picazo-Bueno, {Jos{\'e} {\'A}ngel} and Zeev Zalevsky and Javier Garc{\'i}a and Carlos Ferreira",

note = "Publisher Copyright: {\textcopyright} 2017 SPIE.; Optical Measurement Systems for Industrial Inspection X 2017 ; Conference date: 26-06-2017 Through 29-06-2017",

year = "2017",

doi = "10.1117/12.2270396",

language = "אנגלית",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Peter Lehmann and Goncalves, {Armando Albertazzi} and Wolfgang Osten",

booktitle = "Optical Measurement Systems for Industrial Inspection X",

address = "ארצות הברית",

}

Micó, V, Picazo-Bueno, JÁ, Zalevsky, Z, García, J & Ferreira, C 2017, Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing. in P Lehmann, AA Goncalves & W Osten (eds), Optical Measurement Systems for Industrial Inspection X., 103294C, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10329, SPIE, Optical Measurement Systems for Industrial Inspection X 2017, Munich, Germany, 26/06/17. https://doi.org/10.1117/12.2270396

Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing. / Micó, Vicente; Picazo-Bueno, José Ángel; Zalevsky, Zeev et al.
Optical Measurement Systems for Industrial Inspection X. ed. / Peter Lehmann; Armando Albertazzi Goncalves; Wolfgang Osten. SPIE, 2017. 103294C (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10329).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing

AU - Micó, Vicente

AU - Picazo-Bueno, José Ángel

AU - Zalevsky, Zeev

AU - García, Javier

AU - Ferreira, Carlos

PY - 2017

Y1 - 2017

N2 - We report on the merging between our recently introduced SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) technique and superresolution imaging. SMIM has been previously reported [Opt. Express 22, 14929 (2014); J. Bio. Opt. 21, 106007 (2016)] as a low cost, extremely simple, and highly stable scheme to update a standard microscope into a holographic microscope but, as consequence, the usable FOV is reduced. Superresolution capability enables to enhance the resolution limit in the usable FOV thus compensating the FOV reduction. In this contribution, superresolution is implemented joint together with SMIM defining a new method named as S2MIM (initials incoming from Superresolved Spatially Multiplexed Interferometric Microscopy) which updates a commercially available non-holographic microscope into a superresolved holographic one. Experimental validation is presented for an Olympus BX-60 upright microscope with a USAF resolution test target as calibration object.

AB - We report on the merging between our recently introduced SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) technique and superresolution imaging. SMIM has been previously reported [Opt. Express 22, 14929 (2014); J. Bio. Opt. 21, 106007 (2016)] as a low cost, extremely simple, and highly stable scheme to update a standard microscope into a holographic microscope but, as consequence, the usable FOV is reduced. Superresolution capability enables to enhance the resolution limit in the usable FOV thus compensating the FOV reduction. In this contribution, superresolution is implemented joint together with SMIM defining a new method named as S2MIM (initials incoming from Superresolved Spatially Multiplexed Interferometric Microscopy) which updates a commercially available non-holographic microscope into a superresolved holographic one. Experimental validation is presented for an Olympus BX-60 upright microscope with a USAF resolution test target as calibration object.

KW - Digital holography

KW - Digital image processing

KW - Interference microscopy

KW - Superresolution

KW - Synthetic aperture generation

UR - http://www.scopus.com/inward/record.url?scp=85029162562&partnerID=8YFLogxK

U2 - 10.1117/12.2270396

DO - 10.1117/12.2270396

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

AN - SCOPUS:85029162562

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Optical Measurement Systems for Industrial Inspection X

A2 - Lehmann, Peter

A2 - Goncalves, Armando Albertazzi

A2 - Osten, Wolfgang

PB - SPIE

T2 - Optical Measurement Systems for Industrial Inspection X 2017

Y2 - 26 June 2017 through 29 June 2017

ER -

Micó V, Picazo-Bueno JÁ, Zalevsky Z, García J, Ferreira C. Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing. In Lehmann P, Goncalves AA, Osten W, editors, Optical Measurement Systems for Industrial Inspection X. SPIE. 2017. 103294C. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2270396

Superresolution imaging in spatially multiplexed interferometric microscopy by using time multiplexing

Abstract

Publication series

Conference

Bibliographical note

Funding

Keywords

Access to Document

Other files and links

Fingerprint

Cite this