Subattosecond x-ray Hong–Ou–Mandel metrology

Sergey Volkovich, Sharon Shwartz

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We show that subattosecond delays and subangstrom optical path differences can be measured by using Hong–Ou–Mandel interference measurements with x-rays. Our scheme relies on the subattosecond correlation time of photon pairs that are generated by x-ray spontaneous parametric down-conversion, which leads to a dip in correlation measurements with a comparable width. Therefore, the precision of the measurements is expected to be better than 0.1 attosecond. We anticipate that the scheme we describe in this work will lead to the development of various techniques of quantum measurements with ultra-high precision at x-ray wavelengths.

Original languageEnglish
Pages (from-to)2728-2731
Number of pages4
JournalOptics Letters
Volume45
Issue number10
DOIs
StatePublished - 15 May 2020

Bibliographical note

Publisher Copyright:
© 2020 Optical Society of America

Funding

Israel Science Foundation (201/17).

FundersFunder number
Israel Science Foundation201/17

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