TY - JOUR
T1 - Sub-nanosecond time resolved XAFS of laser excited thin Ge films
AU - Stern, E. A.
AU - Brewe, D. L.
AU - Beck, K. M.
AU - Heald, S. M.
AU - Feng, Y.
PY - 2005
Y1 - 2005
N2 - A facility at PNC-CAT in the Advanced Photon Source measures with sub-nanosecond time resolution both XAFS and diffraction on femtosecond laser-excited samples. XAFS measures with relatively high efficiency the time for the laser excitation to couple to the lattice, the sample temperature after reaching thermal equilibrium, any ablation of the sample with time, and, in many cases can distinguish between the amorphous and crystalline states. Preliminary measurements on 200 nm thick polycrystal Ge films indicate that the time for transferring the laser excitation to thermal heating of the lattice is less than 2?nanoseconds when the initial temperature is 560?K.
AB - A facility at PNC-CAT in the Advanced Photon Source measures with sub-nanosecond time resolution both XAFS and diffraction on femtosecond laser-excited samples. XAFS measures with relatively high efficiency the time for the laser excitation to couple to the lattice, the sample temperature after reaching thermal equilibrium, any ablation of the sample with time, and, in many cases can distinguish between the amorphous and crystalline states. Preliminary measurements on 200 nm thick polycrystal Ge films indicate that the time for transferring the laser excitation to thermal heating of the lattice is less than 2?nanoseconds when the initial temperature is 560?K.
UR - https://www.scopus.com/pages/publications/42149172512
U2 - 10.1238/physica.topical.115a01044
DO - 10.1238/physica.topical.115a01044
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AN - SCOPUS:42149172512
SN - 0281-1847
VL - T115
SP - 1044
EP - 1046
JO - Physica Scripta Topical Issues
JF - Physica Scripta Topical Issues
T2 - 12th X-ray Absorption Fine Structure International Conference, XAFS12
Y2 - 23 June 2003 through 27 June 2003
ER -