Sub-Nanometer Particle Tracking by Point-Spread-Function Spatial Modulation

A Meiri; C Ebeling; J Martineau; Z Zalevsky; J Gerton; R Menon

Sub-Nanometer Particle Tracking by Point-Spread-Function Spatial Modulation

A Meiri, C Ebeling, J Martineau, Z Zalevsky, J Gerton, R Menon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Original language	American English
Title of host publication	Novel Techniques in Microscopy 2015
Publisher	Optical Society of America
State	Published - 2015

Bibliographical note

Place of conference:Canada

Cite this

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title = "Sub-Nanometer Particle Tracking by Point-Spread-Function Spatial Modulation",

abstract = "We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.",

author = "A Meiri and C Ebeling and J Martineau and Z Zalevsky and J Gerton and R Menon",

note = "Place of conference:Canada",

year = "2015",

language = "American English",

booktitle = "Novel Techniques in Microscopy 2015",

publisher = "Optical Society of America",

}

TY - GEN

T1 - Sub-Nanometer Particle Tracking by Point-Spread-Function Spatial Modulation

AU - Meiri, A

AU - Ebeling, C

AU - Martineau, J

AU - Zalevsky, Z

AU - Gerton, J

AU - Menon, R

N1 - Place of conference:Canada

PY - 2015

Y1 - 2015

N2 - We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

AB - We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

UR - https://scholar.google.co.il/scholar?q=Sub-Nanometer+Particle+Tracking+by+Point-Spread-Function+Spatial+Modulation&btnG=&hl=en&as_sdt=0%2C5

M3 - Conference contribution

BT - Novel Techniques in Microscopy 2015

PB - Optical Society of America

ER -

Sub-Nanometer Particle Tracking by Point-Spread-Function Spatial Modulation

Abstract

Bibliographical note

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