Sub-Nanometer Particle Tracking by Point-Spread-Function Spatial Modulation

A Meiri, C Ebeling, J Martineau, Z Zalevsky, J Gerton, R Menon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.
Original languageAmerican English
Title of host publicationNovel Techniques in Microscopy 2015
PublisherOptical Society of America
StatePublished - 2015

Bibliographical note

Place of conference:Canada


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