Sub-nanometer particle tracking by point-spread-function spatial modulation

Amihai Meiri; Carl G. Ebeling; Jason Martineau; Zeev Zalevsky; Jordan M. Gerton; Rajesh Menon

doi:10.1364/ntm.2015.nm2c.3

Sub-nanometer particle tracking by point-spread-function spatial modulation

Amihai Meiri, Carl G. Ebeling, Jason Martineau, Zeev Zalevsky, Jordan M. Gerton, Rajesh Menon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

Original language	English
Title of host publication	Novel Techniques in Microscopy, NTM 2015
Publisher	OSA - The Optical Society
ISBN (Electronic)	9781557529541
DOIs	https://doi.org/10.1364/ntm.2015.nm2c.3
State	Published - 6 Apr 2015
Event	Novel Techniques in Microscopy, NTM 2015 - Vancouver, Canada Duration: 12 Apr 2015 → 15 Apr 2015

Publication series

Name	Novel Techniques in Microscopy, NTM 2015

Conference

Conference	Novel Techniques in Microscopy, NTM 2015
Country/Territory	Canada
City	Vancouver
Period	12/04/15 → 15/04/15

Bibliographical note

Publisher Copyright:
© OSA 2015.

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10.1364/ntm.2015.nm2c.3

Cite this

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title = "Sub-nanometer particle tracking by point-spread-function spatial modulation",

abstract = "We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.",

author = "Amihai Meiri and Ebeling, {Carl G.} and Jason Martineau and Zeev Zalevsky and Gerton, {Jordan M.} and Rajesh Menon",

note = "Publisher Copyright: {\textcopyright} OSA 2015.; Novel Techniques in Microscopy, NTM 2015 ; Conference date: 12-04-2015 Through 15-04-2015",

year = "2015",

month = apr,

day = "6",

doi = "10.1364/ntm.2015.nm2c.3",

language = "אנגלית",

series = "Novel Techniques in Microscopy, NTM 2015",

publisher = "OSA - The Optical Society",

booktitle = "Novel Techniques in Microscopy, NTM 2015",

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}

Meiri, A, Ebeling, CG, Martineau, J, Zalevsky, Z, Gerton, JM & Menon, R 2015, Sub-nanometer particle tracking by point-spread-function spatial modulation. in Novel Techniques in Microscopy, NTM 2015. Novel Techniques in Microscopy, NTM 2015, OSA - The Optical Society, Novel Techniques in Microscopy, NTM 2015, Vancouver, Canada, 12/04/15. https://doi.org/10.1364/ntm.2015.nm2c.3

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AU - Meiri, Amihai

AU - Ebeling, Carl G.

AU - Martineau, Jason

AU - Zalevsky, Zeev

AU - Gerton, Jordan M.

AU - Menon, Rajesh

PY - 2015/4/6

Y1 - 2015/4/6

N2 - We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

AB - We show that the localization precision of single nanoparticles can be improved by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.

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AN - SCOPUS:85086055285

T3 - Novel Techniques in Microscopy, NTM 2015

BT - Novel Techniques in Microscopy, NTM 2015

PB - OSA - The Optical Society

T2 - Novel Techniques in Microscopy, NTM 2015

Y2 - 12 April 2015 through 15 April 2015

ER -

Sub-nanometer particle tracking by point-spread-function spatial modulation

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