Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

Y. Weizman; M. Gurfinkel; A. Margulis; Y. Fefer; Y. Shapira; E. Baruch

Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

Y. Weizman, M. Gurfinkel, A. Margulis, Y. Fefer, Y. Shapira, E. Baruch

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Original language	English
Title of host publication	2005 International Semiconductor Device Research Symposium
Pages	44-45
Number of pages	2
State	Published - 2005
Event	2005 International Semiconductor Device Research Symposium - Bethesda, MD, United States Duration: 7 Dec 2005 → 9 Dec 2005

Publication series

Name	2005 International Semiconductor Device Research Symposium
Volume	2005

Conference

Conference	2005 International Semiconductor Device Research Symposium
Country/Territory	United States
City	Bethesda, MD
Period	7/12/05 → 9/12/05

Cite this

@inproceedings{cee909a1417c4fe18f928c45faaf8719,

title = "Study of leakage-induced photon emission processes in sub-90 nm CMOS devices",

author = "Y. Weizman and M. Gurfinkel and A. Margulis and Y. Fefer and Y. Shapira and E. Baruch",

year = "2005",

language = "אנגלית",

isbn = "1424400848",

series = "2005 International Semiconductor Device Research Symposium",

pages = "44--45",

booktitle = "2005 International Semiconductor Device Research Symposium",

note = "2005 International Semiconductor Device Research Symposium ; Conference date: 07-12-2005 Through 09-12-2005",

}

Weizman, Y, Gurfinkel, M, Margulis, A, Fefer, Y, Shapira, Y & Baruch, E 2005, Study of leakage-induced photon emission processes in sub-90 nm CMOS devices. in 2005 International Semiconductor Device Research Symposium., 1595968, 2005 International Semiconductor Device Research Symposium, vol. 2005, pp. 44-45, 2005 International Semiconductor Device Research Symposium, Bethesda, MD, United States, 7/12/05.

Study of leakage-induced photon emission processes in sub-90 nm CMOS devices. / Weizman, Y.; Gurfinkel, M.; Margulis, A. et al.
2005 International Semiconductor Device Research Symposium. 2005. p. 44-45 1595968 (2005 International Semiconductor Device Research Symposium; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

AU - Weizman, Y.

AU - Gurfinkel, M.

AU - Margulis, A.

AU - Fefer, Y.

AU - Shapira, Y.

AU - Baruch, E.

PY - 2005

Y1 - 2005

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SN - 1424400848

SN - 9781424400843

T3 - 2005 International Semiconductor Device Research Symposium

SP - 44

EP - 45

BT - 2005 International Semiconductor Device Research Symposium

T2 - 2005 International Semiconductor Device Research Symposium

Y2 - 7 December 2005 through 9 December 2005

ER -

Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

Publication series

Conference

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Cite this