Abstract
The high resolution photoexcitation by monochromatized synchrotron radiation was used to measure the x-ray spectrum of tungsten. A phenomenological fit by five Voigt functions was used to determine the line splitting, widths, and the relative intensities of tungsten elements. The results obtained show a highly overlapping underlying structure within the spectral lines.
| Original language | English |
|---|---|
| Pages (from-to) | 22508-22501 |
| Number of pages | 8 |
| Journal | Physical Review A - Atomic, Molecular, and Optical Physics |
| Volume | 63 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2001 |
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