The high resolution photoexcitation by monochromatized synchrotron radiation was used to measure the x-ray spectrum of tungsten. A phenomenological fit by five Voigt functions was used to determine the line splitting, widths, and the relative intensities of tungsten elements. The results obtained show a highly overlapping underlying structure within the spectral lines.
|Number of pages||8|
|Journal||Physical Review A - Atomic, Molecular, and Optical Physics|
|State||Published - Feb 2001|